发明名称 HOLDING PLATE FOR POLISHING SEMICONDUCTOR WAFER
摘要 <p>PURPOSE: To enable a semiconductor wafer.polishing process to be lessened in number of processes, easily controlled, to decrease dimples produced on the surface of a wafer in number, and to make a wafer less deformed and improved in flatness by a method wherein a air-permeable and elastic sheet is provided onto the surface of a air-permeable ceramic plate which holds a semiconductor wafer. CONSTITUTION: A sheet 10 which is fibrous or porous, air-permeable, and elastic is pasted on an air-permeable ceramic plate 3 with adhesive agent 9 keeping high in air-permeability. Or a sheet 10 which is fibrous or porous, air-permeable, and elastic is disposed in tension and fixed onto an air-permeable ceramic plate 3 with a jig 12. The sheet 10 is set as thick as 600μm or below. An outer vacuum pump is actuated to generate a suction force for holding a wafer 1 placed on the sheet 10 when the wafer 1 is polished.</p>
申请公布号 JPH08181092(A) 申请公布日期 1996.07.12
申请号 JP19940321102 申请日期 1994.12.26
申请人 SUMITOMO METAL IND LTD 发明人 FUJITA TAKASHI
分类号 H01L21/683;H01L21/304;H01L21/68;(IPC1-7):H01L21/304 主分类号 H01L21/683
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