| 摘要 |
<p>PURPOSE: To provide a container for a test sample capable of certainly and regularly holding and housing semiconductor elements. CONSTITUTION: Semiconductor elements 9 are placed on a rail-shaped pedestal parts 8 from the opening of a main body part 7 so that a plurality of the semiconductor elements, 9 are regularly arranged on one rail-shaped pedestal part 8 within a plane. By placing the respective semiconductor elements 9 on the adjacent rail-shaped pedestal parts 8, the leads of the adjacent semiconductor elements 9 are brought to a mutual contact state and the respective semiconductor elements 9 come into contact with each other at a narrow pitch to become a fixed state and prevented from colliding with the wall of the main body part 7 being a container for a test sample by the vibration of a test device and, therefore, the leads 10 of the semiconductor elements 9 are not bent or damaged. Since a large number of samples can be housed in one container for the test sample to be tested, the number of the semiconductor elements 9 to be tested is not restricted.</p> |
