发明名称 METHOD OF TREATING A POROUS DIELECTRIC LAYER AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
摘要 Provided are a method to process a porous dielectric layer and a method to manufacture a semiconductor device using the same. The method to process the porous dielectric layer according to an embodiment of the present invention includes the steps of: preparing a substrate where the porous dielectric layer having an aperture is to be formed; forming a first sub sealing film sealing exposed pores by supplying a first precursor on the substrate, wherein the porous dielectric layer includes multiple pores exposed by the aperture; and forming a second sub sealing film covering the first sub sealing film by supplying a second precursor on the first sub sealing film. Each of the first precursor and the second precursor includes a silicon, and the second precursor has a smaller molecular weight than a molecular weight of the first precursor.
申请公布号 KR20160062797(A) 申请公布日期 2016.06.03
申请号 KR20140165321 申请日期 2014.11.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YIM, TAE JIN;OSZINDA THOMAS;KIM, BYUNG HEE;AHN SANGHOON;LEE, NAE IN;JUN, KEE YOUNG
分类号 H01L21/31 主分类号 H01L21/31
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