发明名称 Probe element for coordinate measurement systems
摘要 PCT No. PCT/EP93/03647 Sec. 371 Date Aug. 18, 1994 Sec. 102(e) Date Aug. 18, 1994 PCT Filed Dec. 21, 1993 PCT Pub. No. WO94/15171 PCT Pub. Date Jul. 7, 1994.In a probe element for coordinate measuring systems using micro-probe elements and piezo-resonators which change their resonance characteristics upon contact, the probe element has piezo-resonators arranged in a polygonal configuration. Micro-probe elements are arranged in a polygonal configuration on the piezo-resonators and sense inner and outer surfaces in different coordinates. The tactile sensing of the micro-probe elements on the surface of the specimen is effected by measuring the change in the resonance characteristics of the piezo-resonators.
申请公布号 US5524354(A) 申请公布日期 1996.06.11
申请号 US19940290887 申请日期 1994.08.18
申请人 CARL ZEISS JENA GMBH 发明人 BARTZKE, KARLHEINZ;SEYDEL, EBERHARD;ANTRACK, TORSTEN
分类号 G01B7/012;(IPC1-7):G01B17/06 主分类号 G01B7/012
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