发明名称 |
Probe element for coordinate measurement systems |
摘要 |
PCT No. PCT/EP93/03647 Sec. 371 Date Aug. 18, 1994 Sec. 102(e) Date Aug. 18, 1994 PCT Filed Dec. 21, 1993 PCT Pub. No. WO94/15171 PCT Pub. Date Jul. 7, 1994.In a probe element for coordinate measuring systems using micro-probe elements and piezo-resonators which change their resonance characteristics upon contact, the probe element has piezo-resonators arranged in a polygonal configuration. Micro-probe elements are arranged in a polygonal configuration on the piezo-resonators and sense inner and outer surfaces in different coordinates. The tactile sensing of the micro-probe elements on the surface of the specimen is effected by measuring the change in the resonance characteristics of the piezo-resonators.
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申请公布号 |
US5524354(A) |
申请公布日期 |
1996.06.11 |
申请号 |
US19940290887 |
申请日期 |
1994.08.18 |
申请人 |
CARL ZEISS JENA GMBH |
发明人 |
BARTZKE, KARLHEINZ;SEYDEL, EBERHARD;ANTRACK, TORSTEN |
分类号 |
G01B7/012;(IPC1-7):G01B17/06 |
主分类号 |
G01B7/012 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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