发明名称 Procédé de tapissage ou de remplissage par dépôt en phase gazeuse d'une structure en relief et application de ce procédé pour la fabrication d'éléments semi-conducteurs.
摘要 <p>Process for covering or filling a relief structure, with an aspect ratio of greater than 2 and a spacing of less than 500 nm., involves CVD of one or more insulating, metallic or opt. doped semiconductive chemical species with a growth rate of max. 10 nm./min. Also claimed are: (i) an element with one or more relief structures covered or filled by the above process; (ii) an electroluminescent diode based on doped porous silicon of controlled porosity, the pores being filled by the above process with a solid semiconductive chemical species, oppositely doped w.r.t. the porous silicon, and the network of pores being covered by an epitaxial layer on which a metallic contact is deposited; and (iii) multiple quantum wells comprising an electrochemically produced relief structure covered with an insulating, metallic or opt. doped semiconductive chemical species layer.</p>
申请公布号 FR2716748(B1) 申请公布日期 1996.06.07
申请号 FR19940002197 申请日期 1994.02.25
申请人 FRANCE TELECOM 发明人 BENSAHEL DANIEL;HALIMAOUI AOMAR;BADOZ PIERRE-ANTOINE;CAMPIDELLI YVES
分类号 H01L31/028;H01L31/0352;H01L31/18;H01L33/00;H01L33/34;(IPC1-7):H01L21/205 主分类号 H01L31/028
代理机构 代理人
主权项
地址