发明名称 COMPOUND SEMICONDUCTOR DEVICE
摘要 PURPOSE: To quickly form a flat film by containing magnesium or zinc with a specific concentration for quickening the migration of a semiconductor film from three-dimensional growth to two-dimensional growth. CONSTITUTION: In n-type nitride compound semiconductor crystal film where Si is added, the migration from three-dimensional growth to two-dimensional growth is slow. However, by adding magnesium simultaneously, the migration from the three-dimensional growth to the two-dimensional growth occurs relatively quickly, namely when the film thickness is thin. By adding magnesium, a flat thin film can be formed quickly. However, since magnesium is originally an impurity of acceptor property originally, its excessive addition prevents n-type crystal. The range of impurity concentration for achieving effect is 1&times;10<15> cm<-3> -1&times;10<17> cm<-3> in magnesium and 1&times;10<15> cm<-3> -1&times;10<17> cm<-3> in zinc. Buffer layer 22, n-type GaN layer 23, and n-type InGaN layer 24 are formed on Sapphire substrate 21. The addition of Zn helps a flat thin film to grow and a flat thin film can be formed quickly.
申请公布号 JPH08148718(A) 申请公布日期 1996.06.07
申请号 JP19950221816 申请日期 1995.08.30
申请人 TOSHIBA CORP 发明人 FUJIMOTO HIDETOSHI;NITTA KOICHI;ISHIKAWA MASAYUKI;SUGAWARA HIDETO;KOKUBU YOSHIHIRO;YAMAMOTO MASAHIRO
分类号 H01L21/205;H01L31/04;H01L33/12;H01L33/20;H01L33/32;H01L33/40;H01S5/00;H01S5/323 主分类号 H01L21/205
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