发明名称 Plasma CVD apparatus for manufacturing a semiconductor device
摘要 A plasma CVD apparatus comprises a housing for defining a reaction chamber, a semiconductor wafer holder and lower electrode located within the housing and configured to hold and support a semiconductor wafer thereon. The semiconductor wafer holder and lower electrode is connected to a common ground terminal. An upper electrode is located within the housing and connected to a radio frequency voltage supply. The an upper electrode is positioned separately from but opposite to the semiconductor wafer holder and lower electrode, so that the radio frequency voltage causes a plasma region on a deposition surface of the semiconductor wafer held by semiconductor wafer holder and lower electrode. An ultraviolet lamp is located to irradiate an ultraviolet ray on the deposition surface of the semiconductor wafer held by the semiconductor wafer holder and lower electrode.
申请公布号 US5522935(A) 申请公布日期 1996.06.04
申请号 US19930024226 申请日期 1993.03.01
申请人 NEC CORPORATION 发明人 SATO, AKIRA
分类号 H01L21/205;C23C16/517;(IPC1-7):C23C16/00 主分类号 H01L21/205
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