发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: To increase the surface area of an electrode without increasing the occupation area of a capacitor part by increasing a surface area after formation of a first polysilicon film of a large grain size and by making the surface of a second polysilicon film rough thereon. CONSTITUTION: A first polysilicon film 4 with a fixed grain size is formed on a semiconductor substrate 1, it is immersed in phosphoric acid solution and is separated to a plurality for forming a plurality of island-like first polysilicon films 5. A second polysilicon film 6 is formed on a plurality of island-like first polysilicon films 5, it is immersed in phosphoric acid solution for making a surface of the second polysilicon film 6 rough and a second polysilicon film 7 having an increased surface area is thereby formed. Thereby, it is possible to form a lower electrode of further increased surface area and to increase a surface area of an electrode, namely a capacitance value without increasing an occupation area of a capacitor of a semiconductor device.
申请公布号 JPH08139278(A) 申请公布日期 1996.05.31
申请号 JP19940277778 申请日期 1994.11.11
申请人 NEC CORP 发明人 YOSHIIE MASANOBU
分类号 H01L21/28;H01L21/02;H01L21/265;H01L21/306;H01L21/822;H01L21/8242;H01L27/04;H01L27/108 主分类号 H01L21/28
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