| 摘要 |
PURPOSE: To detect a pattern at a high speed without being affected by noise by detecting the position of a candidate point group having the most similar contour shape to the picture of an object to be detected as the picture position of the object. CONSTITUTION: After an image pickup means 13 obtains image data P(X,Y) by picking up the image of electronic parts 11, arithmetic reference points Cs (Xm , Tn ) are provided at regular intervals on the data P. A main controller 20 sets a template T(Xi , Yi ) which is smaller than the picture of the electrode of the parts 11 and has positional reference points to be matched to the points Cs based on the information about the size of the electrode of the parts 11. An M(Xm , Yn ) calculating means 24 calculates a formula by moving the template T with respect to the data P by successively matching the positional reference points of the template T to each arithmetic reference point Cs . Then a candidate point detecting means 25 detects some of the arithmetic reference points as candidate points from the calculated results and a candidate point grouping means 26 detects the position of a candidate point group having the most similar contour shape to the picture of the object as the picture position of the object. |
