发明名称 EXTREMELY LOW TEMRERATURE COOLING APPARATUS FOR X-RAY DIFFRACTION SAMPLE
摘要 PURPOSE: To carry out precise analysis of a sample by X-ray by making the temperature of the surface part of the sample which is a subject of X-ray diffraction be almost same as the temperature of a sample holder which is measured as the temperature of the sample. CONSTITUTION: A first stage 24 and a second stage 25 are installed as cooling parts in the inside of an air-tight case 5, a sample holder 41 is fixed in a second cooling point 27 of the second stage 25, a sample 4 is fixed in the surface of the sample holder 41 through a sample board 11, and at the same time a heat uniformalizing block 51 which surrounds the outer circumference of the sample 4 is installed in the sample holder 41. Consequently, heat is exchanged between the surface of the sample 4 and the heat uniformalizing block 51 by heat radiation and thus the temperature of the surface of the sample 4 can be kept almost same as the temperature of the heat uniformalizing block 51 and the temperature the sample holder 41 thermally conductively joined with the heat uniformalizing block 51.
申请公布号 JPH08136478(A) 申请公布日期 1996.05.31
申请号 JP19940277525 申请日期 1994.11.11
申请人 AGENCY OF IND SCIENCE & TECHNOL;MAC SCI:KK 发明人 HAYAKAWA HIROSHI;AKIBA ETSUO;NOGUCHI MANABU
分类号 G01N23/207 主分类号 G01N23/207
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