发明名称 Electrostatic discharge protection circuit for a NMOS or lateral NPN transistor
摘要 An electrical circuit including an NMOS or lateral NPN bipolar transistor includes a zener diode connected thereto to provide ESD protection for the transistor. The NMOS transistor includes an N-type source, an N-type drain, a P-type channel region and a gate over and insulated from the channel region. The zener diode is electrically connected between the gate and the drain of the NMOS transistor with the anode of the zener diode being connected to the gate and the cathode of the zener diode being connected to the drain. For some purposes the anode of the zener diode is positioned close to the gate to provide the desired ESD protection. The lateral NPN bipolar transistor includes an N-type emitter and collector and a P-type base. The zener diode is connected between the collector and the base with the anode of the zener diode being connected to the base and the cathode of the zener diode being connected to the emitter.
申请公布号 US5519242(A) 申请公布日期 1996.05.21
申请号 US19940291808 申请日期 1994.08.17
申请人 DAVID SARNOFF RESEARCH CENTER, INC. 发明人 AVERY, LESLIE R.
分类号 H01L27/04;H01L21/822;H01L21/8222;H01L27/02;H01L27/06;H01L29/866;(IPC1-7):H01L23/62 主分类号 H01L27/04
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