| 摘要 |
<p>PURPOSE: To provide a judging method utilizing a structure and an optical characteristic of a liquid crystal panel and eliminating the need of extremely long judging time by judging a line defect in the directions of a scanning line and a signal line by a flow including specified steps. CONSTITUTION: In a step 1, a defect in pixel in the liquid crystal panel is judged, and in the step 2, the display surface incorporating a line defect part of the liquid crystal panel is pressed with prescribed pressure, and is decided by luminance change. In the step 3, relative potential relation of respective signals of the liquid crystal panel are fixed, and an on voltage Vg (H), an off voltage Vg (L) of a scan signal are changed to judge the presence of the luminance change. In the step 4, the presence of abnormality of an input waveform in the input terminal part of the line defect part is judged. In the step 5, resistance between the defect part and a counter electrode terminal is confirmed, and an insulation property of a prescribed resistance value or above is confirmed, and when the resistance is less than a prescribed resistance value, it is judged that counter short circuit mode in which a conductive foreign matter is interposed between the line defect and the counter electrode, and when a prescribed resistance value or above, it is judged that an IC defect mode.</p> |
