发明名称 Semiconductor device using a polysilicium thin film and production thereof
摘要 <p>A semiconductor device containing a polycrystalline silicon thin film wherein crystal grains of the silicon thin film have mainly a columnar structure and a crystal orientation of individual crystal grains is almost in a uniform direction can be produced by depositing a non-impurity-doped silicon thin film (3) or an impurity layer on an interface (30) of an underlying film (2), followed by deposition of impurity-doped silicon thin film (4), if necessary, followed by heat treatment for polycrystallization. <IMAGE> <IMAGE> <IMAGE></p>
申请公布号 EP0707344(A2) 申请公布日期 1996.04.17
申请号 EP19950114554 申请日期 1995.09.15
申请人 HITACHI, LTD. 发明人 MIURA, HIDEO;MORIBE, SHUNJI;KATO, HISAYUKI;KOIKE, ATSUYOSHI;IKEDA, SHUJI;NISHIMURA, ASAO
分类号 H01L21/8247;C23C16/24;C23C16/44;C23C16/455;C23C16/52;H01L21/20;H01L21/205;H01L21/28;H01L21/285;H01L21/336;H01L29/04;H01L29/49;H01L29/78;H01L29/788;H01L29/792;H01L31/18;(IPC1-7):H01L29/04;H01L29/43;H01L29/73 主分类号 H01L21/8247
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