发明名称 Microwave measuring system for surface impedance measurements
摘要 The measuring system has a number of hollow resonators moved across the sample surface so that part of the electromagnetic fields of the resonator oscillation modes are brought into contact with the surface. The oscillation modes are measured for each point across the sample surface and the measured values are used for integral functions providing the real and imaginary components of the surface impedance. Pref. the resonators have a rigid shape so that the surface area covered by each resonator remains constant over the full surface of the sample, with relatively large resonator openings in the microwave range.
申请公布号 DE19500077(C1) 申请公布日期 1996.04.11
申请号 DE19951000077 申请日期 1995.01.04
申请人 DEUTSCHE FORSCHUNGSANSTALT FUER LUFT- UND RAUMFAHRT E.V., 53111 BONN, DE 发明人 MAYER, BERND, 81241 MUENCHEN, DE
分类号 G01R27/26;(IPC1-7):G01R27/02;H01P7/06 主分类号 G01R27/26
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