发明名称 Process for dry-etching a semiconductor substrate
摘要 A thick (10 to 60 micron) photo-lacquer layer is applied to a semiconductor wafer (1) and formed, by photo-lithography, into cylinder-form). This is heated so that the lacquer cylinder melts to form a spherical dome lens structure which is further hardened. Using a plasma the semiconductor wafer and the photo-lacquer lens structure are etched away at precisely the same rate so an identically shaped profile is formed in the surface of the semiconductor. An anti-reflective, compensating layer (3), metal layer (4) and solder-fixing contacts (5) are then added.
申请公布号 EP0706070(A2) 申请公布日期 1996.04.10
申请号 EP19950115231 申请日期 1995.09.26
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 DIETRICH, RALF, DIPL.-ING.;GERHARD, FRANZ, DR. DIPL.-CHEM.
分类号 G02B6/124;(IPC1-7):G02B6/42;C23F1/00 主分类号 G02B6/124
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