发明名称 |
Process for dry-etching a semiconductor substrate |
摘要 |
A thick (10 to 60 micron) photo-lacquer layer is applied to a semiconductor wafer (1) and formed, by photo-lithography, into cylinder-form). This is heated so that the lacquer cylinder melts to form a spherical dome lens structure which is further hardened. Using a plasma the semiconductor wafer and the photo-lacquer lens structure are etched away at precisely the same rate so an identically shaped profile is formed in the surface of the semiconductor. An anti-reflective, compensating layer (3), metal layer (4) and solder-fixing contacts (5) are then added.
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申请公布号 |
EP0706070(A2) |
申请公布日期 |
1996.04.10 |
申请号 |
EP19950115231 |
申请日期 |
1995.09.26 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
DIETRICH, RALF, DIPL.-ING.;GERHARD, FRANZ, DR. DIPL.-CHEM. |
分类号 |
G02B6/124;(IPC1-7):G02B6/42;C23F1/00 |
主分类号 |
G02B6/124 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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