发明名称 |
VOLTAGE SOURCE DRIVING TEST CIRCUIT |
摘要 |
The circuit includes a clear/set controlling unit which has the first and fourth Schmitt triggers that are connected in series, a third Schmitt trigger which output terminal is connected to p-type gate input terminal, a fourth Schmitt trigger which output terminal is connected to n-type gate input terminal, and a transformer gate which forms terminals for VDD and output.
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申请公布号 |
KR960004570(B1) |
申请公布日期 |
1996.04.09 |
申请号 |
KR19940005504 |
申请日期 |
1994.03.18 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JOO, YU - JIN |
分类号 |
H03K17/00;H03K19/173;(IPC1-7):H03K19/173 |
主分类号 |
H03K17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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