DIELECTRIC BREAKDOWN TESTING METHOD,申请号JP19940224325-传众专利搜索

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发明名称	DIELECTRIC BREAKDOWN TESTING METHOD
摘要
申请公布号	JPH0886830(A)	申请公布日期	1996.04.02
申请号	JP19940224325	申请日期	1994.09.20
申请人	TOSHIBA CORP	发明人	HATANO HIROSHI;TSUNASHIMA EIJI
分类号	G01R31/12;(IPC1-7):G01R31/12	主分类号	G01R31/12
代理机构		代理人
主权项
地址

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