| 摘要 |
The invention relates to a method for detecting imperfections on a surface inspected. The method comprises the steps of providing and segmenting image information to form blobs (BL1-BL4); feature extraction for the blobs; clustering of the blobs, in which the image blobs are grouped into several clusters (A, B), each of which contains one or more blobs (BL1-BL4). The clustering is continued by further grouping the clusters (A, B) to form one or more higher-level clusters (AB) comprising lower-level clusters (A, B); and the method also comprises classification in which clusters are compared with imperfection prototypes and one or more clusters are defined that achieve sufficient classification certainty in relation to an imperfection prototype. In the invention, the clusters formed (A, B) are subjected to feature extraction, and the classification is conducted such that in addition to lower-level clusters (A, B), a higher-level cluster (AB) comprising these lower-level clusters (A, B) is compared with the imperfection prototypes. |
