发明名称 |
Integrated circuit testing apparatus and method |
摘要 |
Disclosed is a method and apparatus for the testing of an integrated circuit which is packaged in a housing with leads projecting from the housing and contact elements disposed along one or more of the surfaces of the housing. In the apparatus a plurality of electrical or electronic devices may be temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station.
|
申请公布号 |
US5502397(A) |
申请公布日期 |
1996.03.26 |
申请号 |
US19920975475 |
申请日期 |
1992.11.12 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
BUCHANAN, JAMES M. |
分类号 |
G01R31/28;G01R31/312;G01R31/319;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|