发明名称 CONTACT HOLE FORMING METHOD OF SELF ALIGNED SILICID
摘要 forming the N-region and N+ region of source and drain; depositing ionized metal oxide layer on the oxide layer as the spacer; depositing a first and second isolating oxide layers; depositing polysilicon and nitrogen on the top of the oxide layer and etching back for leaving a necessary part; forming the oxide layer by oxidating the polysilicon region which is not covered by nitride layer; etching oxide layer and forming the first isolating oxide layer in the groove, and forming a metal conductor after etching nitrogen and polysilicon.
申请公布号 KR960004087(B1) 申请公布日期 1996.03.26
申请号 KR19920026878 申请日期 1992.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 PARK, SANG - HOON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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