发明名称 |
CONTACT HOLE FORMING METHOD OF SELF ALIGNED SILICID |
摘要 |
forming the N-region and N+ region of source and drain; depositing ionized metal oxide layer on the oxide layer as the spacer; depositing a first and second isolating oxide layers; depositing polysilicon and nitrogen on the top of the oxide layer and etching back for leaving a necessary part; forming the oxide layer by oxidating the polysilicon region which is not covered by nitride layer; etching oxide layer and forming the first isolating oxide layer in the groove, and forming a metal conductor after etching nitrogen and polysilicon.
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申请公布号 |
KR960004087(B1) |
申请公布日期 |
1996.03.26 |
申请号 |
KR19920026878 |
申请日期 |
1992.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
PARK, SANG - HOON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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