The invention concerns a method of obtaining an X-ray diffractogram with an X-ray diffractometer using an energy-resolving detector, influences from the operation of the diffractometer, detector properties and the background (radiation of energy other than that the useful radiation) being eliminated and full use being made of the available useful radiation (inter alia the characteristic radiation of an X-ray tube). In this way, the measuring time can be reduced to a quarter in comparison with an X-ray diffractometer using a crystal monochromator, whilst the measuring results have the same degree of statistical reliability. The method offers particular advantages for the measuring of weak reflexes in the presence of a high-energy background.
