Doppel- und Simultanprüfung.,申请号DE19906021753T-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Doppel- und Simultanprüfung.
摘要
申请公布号	DE69021753(T2)	申请公布日期	1996.03.21
申请号	DE19906021753T	申请日期	1990.02.02
申请人	HEUFT SYSTEMTECHNIK GMBH, 56659 BURGBROHL, DE	发明人	NELEN, LUCIEN JOHANNES, NL-7471 XT GOOR, NL
分类号	G01N21/88;G01N21/90;(IPC1-7):G01N21/88	主分类号	G01N21/88
代理机构		代理人
主权项
地址

您可能感兴趣的专利

IMAGING APPARATUS, AND DRIVING METHOD THEREOF

APPARATUS AND METHOD FOR GENERATING PULSE LASER

ULTRAVIOLET DISCHARGE LAMP

INFORMATION PROCESSING DEVICE, INFORMATION OUTPUT DEVICE, INFORMATION OUTPUT SYSTEM, COMMUNICATION CONTROL METHOD OF INFORMATION OUTPUT SYSTEM, AND INFORMATION PROCESSING CONTROL PROGRAM

MAHJONG GAME MACHINE

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STORAGE DEVICE

TRENCH GATE TYPE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

ZOOM LENS SYSTEM, INTERCHANGEABLE LENS DEVICE AND CAMERA SYSTEM

GYPSUM-BASED MOLDED BODY, AND METHOD FOR PRODUCING THE SAME

PASTE COMPOSITION FOR FORMING ELECTRODE OF ELECTRIC DOUBLE LAYER CAPACITOR

CLEANING DEVICE AND CLEANING METHOD OF VACUUM DEVICE

SHEET POST-PROCESSING DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THEREOF

HINGE STRUCTURE, AND HINGE STRUCTURE OF TERMINAL CAP