发明名称 Chemical-vapour-deposition of monocrystal silicon-carbide film
摘要 The proportion of the inert gas (Ar) in the hydrogen/argon carrier gas is 30 - 40 %. The ratio of carrier gas and process gas mixt. is 1000:1 to 100000:1. The process gas is a mixt. of silane (SiH4) and a hydrocarbon gas such as methane, acetylene or propane. The process makes a chemical vapour deposition (CVD) of an alpha silicon-carbide ( alpha -SiC) monocrystal film at a process temp. of approximately 1300 deg C under a combined total pressure of carrier and process gases of 10 - 100 kiloPascals with a growth rate of 1 micron per hour.
申请公布号 DE4432813(A1) 申请公布日期 1996.03.21
申请号 DE19944432813 申请日期 1994.09.15
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 RUPP, ROLAND, DR., 91207 LAUF, DE;ROTTNER, KURT, DR., 91097 OBERREICHENBACH, DE
分类号 C23C16/32;C30B25/02 主分类号 C23C16/32
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