| 摘要 |
A test fixture including top and bottom probe plates including double-ended pogo pins interfacing top and bottom interface printed circuit board (IPCBs), further including double-ended transfer pins to achieve a true wireless dual access test fixture. The top transfer pins electrically engage the bottom transfer pins after vacuum is applied to allow electrical interface with the top-side fixture without the use of wires. The top fixture mounts in a frame assembly through a parallel linkage keeping the top fixture parallel with the PCB under test. Guide pins mounted on the bottom probe plate are used to align a top plate holding the PCB and also to pre-align with bushings on the top fixture before vacuum is applied. When vacuum is applied, the top plate and top fixture move in a single longitudinal direction to electrically engage the test pins and test pads, preventing lateral movement which heretofore caused significant damage to the test pins and test pads.
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