Cantilever for atomic force microscope and method of manufacturing the same

摘要

A cantilever for an atomic force microscope, comprising a probe which is formed by a structure including a linear needle crystal at least partially, and a method of manufacturing the cantilever, comprising the steps of applying adhesive to a distal end portion of a cantilever body and placing on the adhesive, in a state where the cantilever body is held substantially horizontally, a structure having a shape of at least four needle crystals combined with one another so as to bond the structure to the distal end portion of the cantilever body. <IMAGE>