DIGITAL-SIGNAL PROCESSING LSI TEST CIRCUIT,申请号JP19940224026-传众专利搜索

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发明名称	DIGITAL-SIGNAL PROCESSING LSI TEST CIRCUIT
摘要
申请公布号	JPH0862297(A)	申请公布日期	1996.03.08
申请号	JP19940224026	申请日期	1994.08.26
申请人	NEC CORP	发明人	ISHIZAWA YOSHIAKI
分类号	G01R31/28;H01L21/66;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
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