TEST CIRCUIT FOR MEMORY,申请号JP19940185629-传众专利搜索

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发明名称	TEST CIRCUIT FOR MEMORY
摘要
申请公布号	JPH0850563(A)	申请公布日期	1996.02.20
申请号	JP19940185629	申请日期	1994.08.08
申请人	FUJITSU GENERAL LTD	发明人	OKADA KAZUO
分类号	G06F12/16;(IPC1-7):G06F12/16	主分类号	G06F12/16
代理机构		代理人
主权项
地址

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