发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND ITS MANUFACTURE
摘要 PURPOSE:To provide a highly reliable layer insulation film by providing an electric wiring layer formed on a semiconductor substrate, an SOG film formed thereon and an SOG film which is formed on a surface thereof and is thicker than the SOG film. CONSTITUTION:An item wherein an n-channel MOSFET is formed using a semiconductor substrate as a starting material is illustrated as a substrate 9 inclusively. An electric wiring layer 10 is formed in a surface of an insulation film 8 formed on the substrate 9. An SOG film 13 formed on the electric wiring layer 10 and an SOG film 14 which is formed on a surface of the SOG film 13 and is thicker than the SOG film 13 are provided. The double layer structure SOG films 13, 14 are applied as a layer insulation film of the electric wiring layer 10. Therefore, the SOG film 13 of a lower layer buried in a recessed part, etc., of the electric wiring layer 10 becomes thick enough to attain satisfactory effect of thermal treatment and highly reliable SOG films 13, 14 can be provided.
申请公布号 JPH0846041(A) 申请公布日期 1996.02.16
申请号 JP19940181191 申请日期 1994.08.02
申请人 HITACHI LTD 发明人 SAITO TOSHIO;AKIMORI HIROYUKI
分类号 H01L23/522;H01L21/316;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L23/522
代理机构 代理人
主权项
地址