发明名称 LDMOS transistor with self-aligned source/backgate and photo-aligned gate
摘要 An embodiment of the present invention is a method of fabricating power and non-power devices on a semiconductor substrate, the method comprising: forming alignment marks in the substrate (100); introducing a dopant of a first conductivity type into the substrate to form high-voltage tank regions (103); annealing the dopants (105); introducing dopants of the first conductivity type and a second conductivity type in a region in the high-voltage tank region (109); annealing the dopants of the first and the second conductivity type to form a second region within a third region, both within the high-voltage tank region, due to the different rates of diffusion of the dopants (110); and forming gate structures after the annealing of the dopants of the first and second conductivity types (122).
申请公布号 US5491105(A) 申请公布日期 1996.02.13
申请号 US19940303792 申请日期 1994.09.09
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SMAYLING, MICHAEL C.;TORRENO, JR., DECEASED, MANUEL L.;FALESSI, GEORGES
分类号 H01L21/324;H01L21/336;H01L21/8234;H01L21/8247;H01L27/06;H01L27/088;H01L27/115;H01L29/06;H01L29/08;H01L29/735;H01L29/78;(IPC1-7):H01L21/822 主分类号 H01L21/324
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