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发明名称
IC TESTING DEVICE
摘要
申请公布号
JPH0829494(A)
申请公布日期
1996.02.02
申请号
JP19940181877
申请日期
1994.07.11
申请人
ADVANTEST CORP
发明人
HOSHINO MASASHI
分类号
G01R31/316;G01R31/28;H03M1/10;(IPC1-7):G01R31/28
主分类号
G01R31/316
代理机构
代理人
主权项
地址
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