发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PURPOSE:To realize a semiconductor device having a polycide gate structure which is not affected by the mutual diffusion of impurities and to realize its manufacturing method. CONSTITUTION:A semiconductor device has a structure wherein a nitrogen-doped amorphous silicon layer 10 is sandwiched between a phosphorus-doped polysilicon layer 8 and a boron-doped poly-silicon layer 9 and a tungsten silicide layer 11 in a polycide gate structure and impurities in the phosphorus-doped polysilicon layer 8 and the boron-doped polysilicon layer 9 are not diffused to each other through the tungsten silicide layer 11. |
申请公布号 |
JPH0831931(A) |
申请公布日期 |
1996.02.02 |
申请号 |
JP19940158660 |
申请日期 |
1994.07.11 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
MIYAKE MASAYASU;NAKAYAMA SATOSHI;KOBAYASHI TOSHIO |
分类号 |
H01L21/28;H01L21/3205;H01L21/768;H01L21/8238;H01L23/52;H01L23/522;H01L27/092;H01L29/43;(IPC1-7):H01L21/768;H01L21/320;H01L21/823 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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