| 摘要 |
<p>PURPOSE:To obtain a semiconductor integrated circuit device having a test circuit for measuring the clock signal skew in a semiconductor chip accurately. CONSTITUTION:Flip-flops 11, 12 are driven with a clock signal and the delay time of an external measurement signal for the flip-flop 11 is set equal to the delay time of an external signal for the flip-flop 12. Outputs of the flip-flops 11, 12 are connected with the input of an XOR 14. The external measurement signal is varied by the resolution of an LSI tester in order to detect a point where the output level of the XOR 14 varies thus measuring skew of the clock signal.</p> |
