发明名称 A METHOD OF TESTING AND AN ELECTRONIC CIRCUIT COMPRISING A FLIPFLOP WITH A MASTER AND A SLAVE
摘要 <p>A flipflop has master and slave interconnected through a buffer. The master has its inverters located outside the signal path from input to output, as the buffer provides the driving capability required for both IDDQ-testing and operational use. This configuration enables IDDQ-testing without further circuitry added to the flipflop and reduces propagation delay in the signal path.</p>
申请公布号 WO1996001434(A1) 申请公布日期 1996.01.18
申请号 IB1995000527 申请日期 1995.06.29
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