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发明名称
METHOD AND JIG FOR TESTING SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH07318612(A)
申请公布日期
1995.12.08
申请号
JP19940115490
申请日期
1994.05.27
申请人
FUJITSU LTD
发明人
OKUYAMA TAKESHI
分类号
G01R31/26;H01L21/66;H01R33/76;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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