发明名称 Particle spectrometer, especially for submicronic particles.
摘要 <p>The spectrometer includes an electrical mobility selector which consists of two concentric discs (18,20). One of the discs (18) presents a circular slit (22) through which an aerosol to be analysed enters the appts. A central suction tube (26) extracts a gas sample from the space between the discs. The discs are conductor and connected to a power source thus generating an electric field (E). A similar circular slit (28) is provided on the second disc (20). A jet of filtered air is injected in the space delimited by the two discs. A mechanical collector 917) traps particles with electrical mobility equal to an adjustable threshold value (Z). &lt;IMAGE&gt;</p>
申请公布号 EP0685727(A1) 申请公布日期 1995.12.06
申请号 EP19950401192 申请日期 1995.05.22
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 POURPRIX, MICHEL
分类号 G01N15/02;G01N15/06;G01N27/64;(IPC1-7):G01N15/06 主分类号 G01N15/02
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