SEPARATE I DDQ-TESTING OF SIGNAL PATH AND BIAS PATH IN AN IC.,申请号EP19950900894-传众专利搜索

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发明名称	SEPARATE I DDQ-TESTING OF SIGNAL PATH AND BIAS PATH IN AN IC.
摘要
申请公布号	EP0685073(A1)	申请公布日期	1995.12.06
申请号	EP19950900894	申请日期	1994.12.05
申请人	PHILIPS ELECTRONICS N.V.	发明人	SACHDEV, MANOJ
分类号	G01R31/28;G01R31/30;G01R31/316;G11C29/04;H01L21/822;H01L27/04;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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