发明名称 MASK FOR X-RAY EXPOSURE
摘要 <p>PURPOSE:To provide an X-ray mask, in which positional distortion due to X-ray irradiation generated when SiN is used as an X-ray transmitting film is reduced and by which the positional accuracy of a pattern can be maintained for a prolonged term. CONSTITUTION:An X-ray mask has at least an X-ray absorptive pattern 24, an X-ray transmitting film holding the X-ray absorptive pattern 24, and a support frame body 21 fixing the outer circumference of the X-ray transmitting film. The X-ray transmitting film is formed in structure, X-ray transmitting films 23, 25, which have compressive stress and stress of which is relaxed by applying X-rays, are formed onto both surfaces of a main X-ray transmitting film 22, which has tensile stress and stress of which is relaxed by applying X-rays, respectively.</p>
申请公布号 JPH07307280(A) 申请公布日期 1995.11.21
申请号 JP19940121829 申请日期 1994.05.11
申请人 SOLTEC:KK;TOPPAN PRINTING CO LTD 发明人 ASHIKAGA KINYA;NOGUCHI FUMINOBU
分类号 G03F1/22;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/22
代理机构 代理人
主权项
地址