发明名称 TEST DEVICE FOR INPUT/OUTPUT DEVICE
摘要 PURPOSE:To enable a conflict test between channels at the same time when the input/output device is tested. CONSTITUTION:This test device is equipped with a test management control means 1 which manages the execution environment of a test of input/output devices with respective equipment numbers and executes an initial setting part, and saves input/output instruction information on the test of the input/output devices with the respective equipment numbers, an input/output instruction output means 2 which outputs input/output instructions to the input/output devices with the respective equipment numbers, a function test group holding means 3 which has plural function tests, each having an initial setting part, a branch instruction, and a result decision part, for the input/output devices with the respective equipment numbers, and a branch instruction replacing means 4 which replaces input/output instructions and branch instructions for the individual function tests and performs control; and the input/output instructions are sent to the respective input/output devices connected to plural channels and then while function tests of the respective input/output devices are conducted, conflict tests are done among the input/output devices and channels.
申请公布号 JPH07306813(A) 申请公布日期 1995.11.21
申请号 JP19940100840 申请日期 1994.05.16
申请人 FUJITSU LTD 发明人 AIHARA TAKUYA;TERANISHI SHINSUKE
分类号 G06F11/22;G06F13/00 主分类号 G06F11/22
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