发明名称 PHOTOSENSITIVE COMPOSITION AND FORMING METHOD OF NEGATIVE PATTERN
摘要 PURPOSE:To provide a forming method of a negative pattern having high sensitivity and high resolution for short wavelength light, especially for light near 250nm wavelength such as KrF excimer laser light. CONSTITUTION:The forming method includes the following processes. A photosensitive compsn. film 2 is formed by applying a photosensitive compsn. containing a polymer having a phenol skeleton, compd. having beta-ketocarboxylic acid ester groups, and compd. which produces acid with light on a substrate 1. The photosensitive compsn. film 2 is exposed to light for patterning and heat treated. The heat treated photosensitive compsn. film 2 is brought into contact with a basic compd. soln. The photosensitive compsn. film 2 is again heat treated, the wholly irradiated with light, and then again heat treated. The photosensitive compsn. film 2 is developed with alkali.
申请公布号 JPH07301912(A) 申请公布日期 1995.11.14
申请号 JP19940149724 申请日期 1994.06.30
申请人 TOSHIBA CORP 发明人 ONISHI KIYONOBU
分类号 G03F7/004;G03F7/038;H01L21/027;(IPC1-7):G03F7/004 主分类号 G03F7/004
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