| 摘要 |
<p>PURPOSE:To provide a built-in testing circuit enabling the realization of passing mode function without causing the enlargement of circuit scale. CONSTITUTION:Output terminals TO1-TO3 are connected not to the Q-output side of flip-flops 11-13 serving as sequential logical circuits but to the output side of exclusive OR circuits 41-43 serving as logical circuits disposed on the D-input side. During a passing mode at the non-testing time, the flip-flops 11-13 are held in the non-acting state, and an input signal DI is outputted as a signal Do as it is from an output terminal To. A built-in testing circuit with passing mode function can be thereby realized without causing the enlargement of circuit scale.</p> |
