Test signal output circuit in LSI

摘要

An object of the present invention is to reduce the number of external connection terminals of an LSI that are required for performing testing in an operating state. The test signal output circuit of the present invention comprises one or more test signal output terminals, one or more test mode signal input terminals, a decoder for interpreting signals from the test mode signal input terminals, and one or more selectors for selecting internal signals in response to the output of the decoder and outputting the selected signals from the respective test signal output terminal.