发明名称 INTERRUPTION TEST SYSTEM FOR LAGGING CURRENT
摘要 <p>PURPOSE:To provide an interruption test system for phase lagging current in which a transient oscillatory voltage being applied across a switch to be tested, upon opening thereof, has frequency characteristics conformable to the actual operating conditions. CONSTITUTION:The test system for phase lag current interruption comprises an adjusting capacitor 8 being charged with a test power supply 2 to form a transient power supply, an adjusting capacitor 9 connected between the opposite ends 1a, 1b of a switch to be tested, an auxiliary switch 10 interlocked with the switch to disconnect a load, a discharge gap 11 closed by a zero phase current flowing between the opposite ends 1a, 1b of the switch upon opening thereof, and an adjusting inductance 12 connected between the end 1b and the gap 11 or between the gap 11 and an earth point 5. The capacitor 8 is set to have no influence on the frequency of transient oscillatory voltage produced between the ends 1a and 1b through discharge of the transient power supply upon opening of the switch 1. The capacitor 9 and the inductance 12 are set such that the transient oscillatory voltage has a predetermined frequency depending on the actual operating conditions of the switch.</p>
申请公布号 JPH07280897(A) 申请公布日期 1995.10.27
申请号 JP19940093784 申请日期 1994.04.06
申请人 NISSIN ELECTRIC CO LTD 发明人 ISHII HIROMI
分类号 G01R31/34;H01H11/00;(IPC1-7):G01R31/34 主分类号 G01R31/34
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