发明名称 RESIST PATTERN FORMATION AND ITS DEVICE
摘要 PURPOSE:To prevent oxidation of silicon atom in resist and to carry out highly accurate patterning at high throughput by carrying out all the operations including carrying of a substrate from an exposure process to a development process in non-oxidizing atmosphere wherein oxidizing gas such as oxygen does not exist. CONSTITUTION:A development chamber 16 provided with a vacuum evacuation system is installed besides an exposure chamber 15. Both chambers are connected by gate valves 11, 12, 13, 14 or by the gate valves 11, 12, 13, 14 and a sub-chamber. A substrate after exposure is carried into the development chamber 16 without being brought into contact with air. Thereby, generation of silicon oxide is prevented.
申请公布号 JPH07283112(A) 申请公布日期 1995.10.27
申请号 JP19940070386 申请日期 1994.04.08
申请人 HITACHI LTD;SOLTEC:KK 发明人 YAMAGUCHI ATSUKO;OGAWA TARO;SOGA TAKASHI;UCHIDA FUMIHIKO;ITO MASAAKI;MATSUZAKA TAKASHI;TAKEDA EIJI;OIIZUMI HIROAKI
分类号 G03F7/075;C23F1/00;G03F7/36;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/075
代理机构 代理人
主权项
地址