发明名称 |
Semiconductor device having increased current capacity |
摘要 |
A general object of the present invention is to make a maximum controllable current large without exerting adverse effect on other characteristics. In a surface of an n- layer 2 formed on a p+ substrate 1, p diffusion regions 3a, 3b and 3c are formed separated by n+ diffusion regions 4a, 4b and an oxidation film 9. Above the p diffusion regions 3a and 3b, gate electrodes 5a and 5b are formed insulated from the surrounding by an oxidation film 6. An Al-Si electrode 7 is in contact with the p diffusion region 3a and the n+ diffusion region 4a while a metal electrode 8 is in contact with the p+ substrate 1. By virtue of interposition of the oxidation film 9, a thyristor consisting of the n+ diffusion region 4a , p diffusion region 3a, n- layer 2 and p+ substrate 1 is prevented from being actuated. |
申请公布号 |
US5460981(A) |
申请公布日期 |
1995.10.24 |
申请号 |
US19940319520 |
申请日期 |
1994.10.07 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
TERASHIMA, TOMOHIDE;MAJUMDAR, GOURAB |
分类号 |
H01L29/78;H01L21/332;H01L21/336;H01L29/06;H01L29/74;H01L29/749;(IPC1-7):H01L21/332 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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