发明名称 |
THIN FILM TRANSISTOR FABRICATION PROCESS |
摘要 |
vacuum-evaporating a first polysilicon on an insulating film and injecting impurity ion on the surface of the polysilicon to form a damage layer; selectively inclining the first polysilicon to form an inclined gate and source/drain electrodes; vacuum-evaporating a gate insulating film on the whole surface to form a contact hole on the source/drain electrodes; and vacuum-evaporating a second polysilicon on the whole surface and injecting impurity ion on the surface of the second polysilicon to form a source/drain impurity area.
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申请公布号 |
KR950012737(B1) |
申请公布日期 |
1995.10.20 |
申请号 |
KR19920024910 |
申请日期 |
1992.12.21 |
申请人 |
LG SEMICONDUCTOR CO., LTD. |
发明人 |
KIM, JONG - KWAN |
分类号 |
H01L27/01;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L27/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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