发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To improve the electromigration resistance of a wiring connected with a pad. CONSTITUTION:In the title semiconductor device, a wiring 11b composed of metal containing aluminum is connected with a pad 13a which is composed of the metal containing aluminum and turned into an outward leading-out terminal, via a wiring 11a which is formed on a layer different from the wiring or the pad and composed of refractory material.</p>
申请公布号 JPH07263446(A) 申请公布日期 1995.10.13
申请号 JP19940046238 申请日期 1994.03.17
申请人 FUJITSU LTD 发明人 OTSUKA TOSHIYUKI
分类号 H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L21/82;H01L23/522;(IPC1-7):H01L21/320 主分类号 H01L23/52
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