| 发明名称 |
TEST DEVICE FOR INTEGRATED CIRCUIT |
| 摘要 |
<p>PURPOSE: To enable to test an integrated circuit without the use of dedicated test pads. CONSTITUTION: An integrated circuit is provided with at least one access pad 1. The pad is connected to a device 4 of an inner circuit through a capacitor 2, provided with two opposed conductive layers insulated from each other. A lower conductive layer 21 is connected to the pad, and an upper conductive layer 25 is connected to the device. As a result, the upper conductive layer 25 forms a direct current testing pad.</p> |
| 申请公布号 |
JPH07263506(A) |
申请公布日期 |
1995.10.13 |
| 申请号 |
JP19940337020 |
申请日期 |
1994.12.27 |
| 申请人 |
SGS THOMSON MICROELECTRON SA |
发明人 |
NIKORASU UIRIAMU SUMEAARU |
| 分类号 |
G01R31/26;G01R31/28;H01L21/66;H01L21/822;H01L23/485;H01L23/58;H01L27/04;(IPC1-7):H01L21/66 |
主分类号 |
G01R31/26 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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