APPARATUS AND METHOD FOR MEASUREMENT OF SIZE OF BRICK,申请号JP19940074357-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	APPARATUS AND METHOD FOR MEASUREMENT OF SIZE OF BRICK
摘要
申请公布号	JPH07260465(A)	申请公布日期	1995.10.13
申请号	JP19940074357	申请日期	1994.03.17
申请人	KAWASAKI REFRACT CO LTD	发明人	KATO HARUJI
分类号	G01B21/00;G01B21/20;G06F17/40;(IPC1-7):G01B21/00	主分类号	G01B21/00
代理机构		代理人
主权项
地址

您可能感兴趣的专利

BATTERY WIRING MODULE AND BATTERY WIRING MODULE MANUFACTURING METHOD

ENERGY STORAGE APPARATUS

ELECTRODE LAMINATE AND ORGANIC LIGHT EMITTING DEVICE ELEMENT

CONDUCTIVE PASTE FOR INTERNAL ELECTRODE, PIEZOELECTRIC ELEMENT, AND PIEZOELECTRIC VIBRATION MODULE INCLUDING THE SAME

PIEZOELECTRIC THIN FILM DEVICE AND METHOD FOR MANUFACTURING THE SAME

DISPENSER PRINTED MECHANICALLY-ALLOYED P-TYPE FLEXIBLE THERMOELECTRIC GENERATORS

LIGHT EMITTING DEVICE AND METHOD OF MANUFACTURING LIGHT EMITTING DEVICE

METHOD FOR SEPARATING EPITAXIAL LAYERS FROM GROWTH SUBSTRATES, AND SEMICONDUCTOR DEVICE USING SAME

COMPOSITE QUANTUM-DOT MATERIALS FOR PHOTONICS DETECTORS

Semiconductor Device and Method for Manufacturing the Same

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECTRICAL JUNCTION AND DEVICES INCORPORATING SUCH JUNCTIONS

METHOD FOR DEPINNING THE FERMI LEVEL OF A SEMICONDUCTOR AT AN ELECTRICAL JUNCTION AND DEVICES INCORPORATING SUCH JUNCTIONS

REVERSE CONDUCTING INSULATED GATE BIPOLAR TRANSISTOR

FIN REPLACEMENT IN A FIELD-EFFECT TRANSISTOR

FINFET TRANSISTOR

ORGANIC LIGHT-EMITTING DIODE DISPLAY AND METHOD OF MANUFACTURING THE SAME

METHOD OF MANUFACTURING CMOS IMAGE SENSOR

CARRIER FOR ADSORPTION AND METHOD FOR PRODUCING SAME

DISPLACEMENT CONTROL VALVE OF VARIABLE DISPLACEMENT COMPRESSOR