发明名称 ABNORMALITY DIAGNOSTIC DEVICE
摘要 <p>PURPOSE:To obtain an abnormality diagnostic device for automating a parameter tuning capable of hunting time sequential data by calculating a tuning parameter for hunting calculation only from time sequential data without preparing a reference value. CONSTITUTION:The abnormality diagnostic device is provided with a spectrum calculating means 21 for finding out a power spectrum from time sequential data and a spectrum shape calculating means 22 for finding out the peak frequency f0 of the power spectrum and frequency values f1, f2 applying half band width. A hunting parameter determining means 23 finds out tuning parameters T1, T2 for a hunting calculating expression T1S/ (1+T2S) from the frequency values f0, f1, f2 found out by the means 22 based upon T1=1/2pif1, f1=2f0/pi, T2=1/2pif2, and f2=4f0/pi. Since all tuning parameters for hunting data can be calculated from the time sequential data based upon the calculation, automatic parameter tuning can be attained.</p>
申请公布号 JPH07244522(A) 申请公布日期 1995.09.19
申请号 JP19940031691 申请日期 1994.03.02
申请人 FUJI FACOM CORP 发明人 AKATSUKA TAKASHI
分类号 G06F13/00;G05B11/36;G05B23/02;(IPC1-7):G05B23/02 主分类号 G06F13/00
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