| 摘要 |
A spring probe (pogo pin) contactor for testing PGA (Pin Grid Array) devices that limits compression of pogo pins within the spring probe contactor is disclosed. A PGA device has a plurality of device pins extending therefrom for insertion into the spring probe contactor in order to test the PGA device. At least one device pin of the plurality of device pins is provided with a widened annular portion expanding from a portion of the one device pin. A surface of the spring probe contactor has an array of apertures for receiving each device pin of the plurality of device pins of the PGA device in order to make contact with and compress the pogo pins. A cavity is coupled to the surface of the spring probe contactor which corresponds to and mates with the widened annular portion of the one device pin in order to limit an amount of insertion of the PGA device, thereby limiting the compression of the pogo pins. Although a single pin having the widened annular portion in combination with the cavity is sufficient for limiting the compression of the pogo pins, a four pin and four cavity arrangement, as well as other arrangements are possible.
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